Femtosecond laser ablation-based preparation methods for high resolution materials characterization
Watch our free webinar on “Femtosecond laser ablation-based preparation methods for high-resolution materials characterization”
Are you ready to revolutionize your specimen preparation processes? We are excited to present you a webinar featuring Dr. Tkadletz from Montanuniversität Leoben, who will explore the latest advancements in integrating modern specimen preparation equipment for transmission electron microscopy (TEM) and atom probe tomography (APT). This webinar will provide insights into how these modern specimen preparation techniques can significantly reduce complexity, improve efficiency, and facilitate faster and more effective investigations in materials research.
Our partner, Rave Scientific, is hosting the webinar.
Key Highlights:
- Cutting-Edge Integration: Discover how combining fs-laser ablation systems like the 3D-Micromac microPREP PRO FEMTO with focused (FIB) and broad (BIB) ion-beam polishing devices sets new standards in specimen preparation.
- Efficiency and Flexibility: Learn about the significant advantages of reduced effort, exceptional time efficiency, and flexibility in designing specimen geometries such as discs, half-grids, microtip arrays, and whole sample holders.
- Rapid Pre-Preparation: Understand how fs-laser ablation enables the rapid pre-preparation of TEM and APT specimens, often within minutes, streamlining the final preparation steps.
- Advanced Techniques: Explore the integration of complementary techniques like electron backscatter diffraction, energy dispersive X-ray spectroscopy, and FIB secondary ion mass spectroscopy for site-specific preparation.
- Eliminating Conventional Steps: See how modern techniques eliminate the need for FIB lift-outs and conventional dimple grinding, optimize materials research workflows, and enhance specimen throughput.
Speaker: Dipl.-Ing. Dr.mont. Michael Tkadletz (Chair of Functional Materials and Materials Systems, Montanuniversität Leoben, Austria)
SEM image of the processed Titanium Nitride on Silicon microtip arrays prepared by microPREP® PRO FEMTO directly from the specimen